References

1. Forecasting Cost and Yield, Pranab K. Nag, Wojciech Maly, Hermann Jacobs

2. Yield Learning Simulation, Pranab K. Nag and Wojciech Maly

3. Simulation of Yield / Cost Learning Curves with Y4 by Pranab K. Nag*, Wojciech Maly* and Hermann Jacobs**

4. Automated analysis for Rapid Defect Sourcing and Yield Learning by Kenneth W. Tobin and Shaun S. Gleason, Oak Ridge National Laboratory, Fred Lakhani from SEMATECH, Marylyn H. Bennett from Texas Instruments, Inc.

5. Comparative Assessment of Yield Learning Tools Using Information Theory by Charles Weber, Vijay Sankaran, Kenneth W. Tobin Jr . and Gary Scher

6. Yield Forecasting, A Ph.D dissertation by Pranab K. Nag

Other Papers

[1] Rapid Yield Learning through Optical Defect and Electrical Test Analysis , Shaun S. Gleason, Kenneth W. Tobin , Thomas P. Karnowski , Fred Lakhani, Oak Ridge National Laboratory 2 , Oak Ridge, TN, 37831

[2] J. A. Cunningham, “Using the learning curve a management tool”, IEEE Spectrum, pp. 45-48, June, 1980.

[3]. D. Dance and R. Jarvis, “Using Yield Models to Accelerate Learning Curve Progress”, IEEE Trans. on Semiconductor Manufacturing, vol. 5, no. 1, pp.41-46, Feb, 1992.

[4]. D. R. LaTourette, “A Yield Learning Model for Integrated Circuit Manufacturing”, Semiconductor International, pp. 163-170, July, 1995.

[5]. A. Gupta and J. Lathrop, “Yield Analysis of Large Integrated-Circuit Chips,” IEEE Journal of Solid-State Circuits, vol. SC-7, no. 5, pp. 389-395, October1972.

[6] Y-J. Kwon and D.M.H. Walker, “Yield Learning via Functional Test Data”, 1995 Proc. of International Test Conf, pp. 626-635, 1995.