ENME Webcast Archives

LEADERS IN MECHANICAL ENGINEERING LECTURE SERIES - SPRING 2008

Reliability and Yield of Microelectronics-Nano Products

Lecturer: Way Ku - Dean of Engineering at the University of Tennessee

Original Air Date: Friday, April 11th at 2:00pm

Abstract: In this talk, we present an overview of yield, reliability and burn-in as practiced in the semiconductor manufacturing industry. Reliability and yield modeling can be used as a foundation in developing effective stress burn-in, which in turn can warranty high quality for semiconductor products. Yield models are described and their advantages and disadvantages are discussed. It is high reliability, not an efficient scheduling, that can enhance yield of microelectronics/nano products. Because low yield will likely be a big issue in nano manufacturing, this talk will also help deal with reliability enhancement strategies in design and manufacturing for nano products.