Faculty

• Dr. Peter Sandborn
• Dr. Michael Pecht
• Dr. Abhijit Dasgupta
• Dr. F. Patrick McCluskey

Microtester

Current Capabilities

• Decapsulating/Delidding
• Microtesting
• Energy Dispersive Microscopy and Spectorscopy
• Focused Ion Bean (FIB) Imaging
• Transmission Electron Microscopy
• Assessment of Popcorning in PEMs
• Differential Scanning Calorimetry
• Thermomechanical Analysis
• Dynamic Mechanical Analysis
• Microidentiation
• Contact Resistance Measurements
• Ion Chromatography
• Optical Microscopy and Microsectioning
• Scanning Electron Microscopy
• X-ray Microscopy
• Scanning Acoustic Microscopy
• Infrared Inspection System
• Fourier Transform Infrared
• Spectroscopy
• Contact Resistance measurements
• Atomic Force Microscopy

Cross-sectioning of Failed Capacitor

Delamination (seen in red) at
molding compound and die interface

Cross-sectioning of PWB

   Intermetallic Growth between
   Wire Bond and Bond Pad

Electrical Overstress